Kontūrų ir paviršiaus matavimo sistemaChotest
SJ5760
Kontūrų ir paviršiaus matavimo sistema
Chotest
SJ5760
EXW fiksuota kaina neįskaitant PVM
18 900 €
Gamybos metai
2024
Sąlyga
parodomoji mašina
Vieta
Leonberg 

Rodyti vaizdus
Rodyti žemėlapį
Duomenys apie mašiną
- Įrenginio aprašas:
- Kontūrų ir paviršiaus matavimo sistema
- Gamintojas:
- Chotest
- Modelis:
- SJ5760
- Gamybos metai:
- 2024
- Sąlyga:
- beveik kaip naujas (parodų įrenginys)
- Darbo valandos:
- 15 h
Kaina ir vieta
EXW fiksuota kaina neįskaitant PVM
18 900 €
- Vieta:
- Mühlstraße 41, 71229 Leonberg, Deutschland

Skambinti
Pasiūlymo informacija
- Sąrašo ID:
- A20678575
- Naujinta paskutinį kartą:
- Data 2025.12.04
Aprašymas
Precision Profile Measuring Instrument | Excellent Condition | Ready for Immediate Use
For sale is a Chotest SJ-5760P, a high-precision contour measuring device for geometric profile analysis in quality management, toolmaking, mechanical engineering, and research. This unit delivers precise measurements with a large range of motion and a stable granite base.
⸻
Condition
• Used, technically inspected
• Fully functional
• Very well-maintained condition
⸻
Technical Highlights – Chotest SJ-5760P
Travel Ranges
• X-axis: 0–200 mm
• Z-axis: 0–450 mm
• Device dimensions: 800 × 450 × 1100 mm
• Weight: 220 kg
⸻
Profile Measurement (SJ-5760P)
• Z1 measuring range: ±25 mm
• Resolution: 0.001 µm
• Measuring direction: Top / Down
• Measuring speed: 0.05–5 mm/s
• Positioning speed: X/Z up to 20 mm/s
Codsx Db Stjpfx Admjaa
• Measuring force: 10–150 mN, adjustable
• Guideway deviation: ≤1 µm / 200 mm
Accuracy
• X-display error: ±(0.5 + 0.015L) µm
• Z1 display error: ±(0.5 + 0.05H) µm
• Distance: ±(0.8 + 0.02L) µm
• Radius: ≤(1 + R/15) µm
• Angle: ≤±45’’
⸻
Special Features
• Ideal for high-precision contour and profile measurements
• Extremely high vertical resolution (0.001 µm)
• Very stable granite base for vibration-free measuring
• Large travel ranges for versatile component geometries
• User-friendly and reliable measuring technology
• Suitable for micron-level form measurements in laboratory and production use
Skelbimas verčiamas automatiškai, todėl jame gali būtų vertimo klaidų.
For sale is a Chotest SJ-5760P, a high-precision contour measuring device for geometric profile analysis in quality management, toolmaking, mechanical engineering, and research. This unit delivers precise measurements with a large range of motion and a stable granite base.
⸻
Condition
• Used, technically inspected
• Fully functional
• Very well-maintained condition
⸻
Technical Highlights – Chotest SJ-5760P
Travel Ranges
• X-axis: 0–200 mm
• Z-axis: 0–450 mm
• Device dimensions: 800 × 450 × 1100 mm
• Weight: 220 kg
⸻
Profile Measurement (SJ-5760P)
• Z1 measuring range: ±25 mm
• Resolution: 0.001 µm
• Measuring direction: Top / Down
• Measuring speed: 0.05–5 mm/s
• Positioning speed: X/Z up to 20 mm/s
Codsx Db Stjpfx Admjaa
• Measuring force: 10–150 mN, adjustable
• Guideway deviation: ≤1 µm / 200 mm
Accuracy
• X-display error: ±(0.5 + 0.015L) µm
• Z1 display error: ±(0.5 + 0.05H) µm
• Distance: ±(0.8 + 0.02L) µm
• Radius: ≤(1 + R/15) µm
• Angle: ≤±45’’
⸻
Special Features
• Ideal for high-precision contour and profile measurements
• Extremely high vertical resolution (0.001 µm)
• Very stable granite base for vibration-free measuring
• Large travel ranges for versatile component geometries
• User-friendly and reliable measuring technology
• Suitable for micron-level form measurements in laboratory and production use
Skelbimas verčiamas automatiškai, todėl jame gali būtų vertimo klaidų.
Dokumentai
Tiekėjas
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Registruota nuo: 2023
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