Komponentas

unbekannt CTX125 X-RAY System Kontrolleinheit

Gamybos metai: 2025, Sąlyga: naujas, X-ray inspection system for medium-sized packages and pouches. Suitable for detecting foreign objects made of metal, glass, stone, plastic, etc. in food or non-food products. - Specifications: Conveyor belt width: 410 mm; Detection accuracy: lead from Ø 0.2 mm, iron from Ø 0.28 mm, stainless steel from Ø 0.28 mm, non-metallic such as stone, glass from Ø 1.2 mm; X-ray power: 80 kVp, 1.25 mA; Detector resolution: 0.4 mm; X-ray emissions: < 1 µSv/h; Conveyor belt height: 850 ± 30 mm; Conveyor belt speed (depending on product): 10–100 m/min; Operating interface: 15" touchscreen; Software: intellisens® X-ray; Operating temperature: 5–35 °C; Ejection system: optionally available as required; Power supply: 220VAC, 50/60Hz; System dimensions: L900xW920xH1825 mm; Weight: 350 kg. Please note that our new prices are often lower than typical used equipment prices. Feel free to contact us with your packaging requirements. – We usually have 30–50 different new machines available from stock for immediate delivery. In addition, we offer very short delivery times of approximately 3 weeks for custom-built machines. – All machines are supplied with a full warranty. Iiedpov Nm Inofx Abkjk

Sąlyga: Defektas atsarginių dalių laikiklis (naudotas), Oxford Instruments X-Strata 960 X-ray Fluorescence Analyzer – For Parts/Defective Item Description: For sale is a used Oxford Instruments X-Strata 960 X-ray fluorescence analyzer. The unit comes from a laboratory decommission and is offered exclusively as a donor for spare parts or for repair purposes. No functionality check has been performed – therefore, the device is considered defective for the purpose of this sale. Technical Specifications – Oxford Instruments X-Strata 960 (non-binding) Feature Description Model: X-Strata 960 Manufacturer: Oxford Instruments Analysis Method: X-ray fluorescence analysis (XRF) Applications: Coating thickness measurement, materials analysis, precious metal testing Measurement Geometry: Top-down or bottom-up, depending on configuration Radiation Source: X-ray tube (e.g., Rhodium anode), 50–100 W output Detector: Proportional counter or silicon drift detector (SDD), depending on configuration Measurement Range: Coating thickness approx. 0.005 – 50 µm (material-dependent) Spot Size: Approx. 15 μm – 1 mm (depending on collimator) Z-Axis: Motorized, up to approx. 230 mm measuring height Sample Chamber (W × D × H): Approx. 580 × 510 × 230 mm Sample Table: Manual or motorized (200 × 200 mm or larger, depending on equipment) Focusing System: Optical / laser focus, partially automatic Operating System: Integrated industrial PC with Windows-based evaluation software Power Supply: 220–240 V / 50–60 Hz / approx. 500–800 W Device Weight: Approx. 150–200 kg (depending on configuration) Condition: Used / defective / for spare parts Scope of Delivery: As shown in pictures – no accessories or software included Important Notes: Sale expressly as a defective device without functional guarantee. The item is offered as a spare parts donor or for tinkerers. No warranty for function, completeness, or technical parameters. Commercial sale with exclusion of any liability for material defects under § 447 BGB (shipment sale). Scope of Delivery: - Oxford Instruments X-Strata 960 - All components shown in the pictures Any other parts, accessories, or documentation are not included unless explicitly stated. Iedpfx Abohaapfekjik Shipping & Collection: Collection possible and preferred in Borken Shipping possible by arrangement (Technical specifications and statements are subject to change and errors!) For further questions, feel free to contact us by phone.

Gamybos metai: 2016, Sąlyga: labai geros būklės (naudotas), Automatic X-ray Inspection For the inspection of BGA, QFN, THT, LED, LGA, and other solder joints, both visible and hidden. Isdpfxowpuads Abkeik Other features: Includes offline station and repair station OS: Windows 7 Ultra-high speed line-scan CCD detectors Inspection area: 450 mm x 400 mm Imaging: 2D, 2.5D, 3D (layer images with planar CT) PCB dimensions: 60 – 450 x 50 – 400 mm AXI resolution: 6 – 30 μm / px AOI: Camera field of view: 42 mm x 42 mm Resolution: 21 μm Inspection height: -3 to 7.5 mm Optics: telecentric Transport height: 950 mm +/- 25 mm Interface: SMEMA Width adjustment: automatic

Gamybos metai: 2016, Sąlyga: paruoštas naudoti (naudotas), A nearly new Anritsu X-ray inspection system is available. X-ray output: 100W, maximum detection width: 240mm, maximum detection height: 120mm, detection speed for 2kg to 5kg: 10m-60m/min, detection speed up to 2kg: 60m-90m/min, detection speed for 5kg to 10kg: 10m-40m/min, housing material: stainless steel, machine weight: approx. 255kg, operating hours: under 50h. The machine shows no signs of wear on the conveyor belt or radiation shielding curtains. Documentation available. On-site inspection is possible. Iodjvzr Auepfx Abksik

Sąlyga: naudotas, PANalytical PANalytical X’Pert PRO MPD X-Ray Diffractometer (XRD) Extract from Service Report: Device: PANalytical X’Pert PRO MPD Created on: 07.07.2021 Work Performed: - Reinstallation and commissioning of the system - Connection of external supply lines - Warm-up phase - Complete calibration of the goniometer and other components - Maintenance including replacement of defective parts Replacement parts used: L 3.6V NC/U3 R15.0X52.0 BATTERY. NI-CD Fan for X-Celerator unit Filter, water Motor PW3050 ("Unit was not tested at our facility") The X’Pert PRO MPD is a highly versatile and powerful X-ray diffractometer (XRD) designed for structural characterization of crystalline materials. It is ideal for both pure research and routine applications in industry and academia. Its modular design, rapid detection capability, and precise temperature and atmosphere control make it excellently suited for both routine analyses and complex in-situ experiments. Key Features: Multiple measurement geometries possible: • Reflection in Bragg-Brentano (θ–2θ) mode • Transmission geometry for powders in capillaries • Optionally SAXS (Small-Angle X-ray Scattering) for nanostructures Radiation source and detectors: • Typically copper anode (Cu-Kα, λ ≈ 1.54 Å) • X’Celerator detector (1D, ultra-fast) for parallel data acquisition Modular system with PreFIX technology: • Fast interchange of optics and sample stages without recalibration Iisdpfxjwycats Abkek In-situ measurements at high temperatures: • Measurements possible up to approx. 1200°C Controlled atmosphere: Air, nitrogen, oxygen (limited reducing atmosphere) Typical Applications: • Phase analysis and quantitative Rietveld refinement • Determination of crystallite size, microstrain, residual stress • In-situ investigation of phase transitions, oxidation, crystallization, etc. • SAXS measurements for analysis of nanoparticles, pore structures • Broad sample range: powders, thin films, ceramics, pharmaceuticals, catalysts, and more Technical Specifications (typical): Property & Specification Angular range (2θ): approx. 0.5° to 150° Step size: up to 0.002° or finer Goniometer: Vertical, 0–0, radius approx. 240 mm Temperature range: Room temperature to approx. 1200°C Atmosphere: Air, N₂, O₂ (limited reducing conditions) Detectors: X’Celerator (1D), proportional counter Distribution & Areas of Application: The X’Pert PRO MPD is in use worldwide, e.g. at: Universities (ETH Zurich, TU Dresden, University of Vienna) Research institutes (e.g. Max-Planck-Institutes, ICN2, IS2M) Industry (e.g. materials development, pharma, chemicals) Condition: used Scope of delivery: (see pictures) (Specifications subject to change and errors excepted!) For further questions, please don’t hesitate to contact us by phone.

Sąlyga: geras (naudotas), Helmut Fischer Fischerscope X-ray Fluorescence Coating Thickness Measurement XDL-XYmZ Isdpfx Abew Hbkdoksik