Rentgeno difraktometras (XRD)PANalytical
X’Pert PRO MPD
Rentgeno difraktometras (XRD)
PANalytical
X’Pert PRO MPD
fiksuota kaina neįskaitant PVM
13 500 €
Sąlyga
Naudotas
Vieta
Borken 

Rodyti vaizdus
Rodyti žemėlapį
Duomenys apie mašiną
- Įrenginio aprašas:
- Rentgeno difraktometras (XRD)
- Gamintojas:
- PANalytical
- Modelis:
- X’Pert PRO MPD
- Sąlyga:
- naudotas
Kaina ir vieta
fiksuota kaina neįskaitant PVM
13 500 €
- Vieta:
- Einsteinstraße 8a, 46325 Borken, DE
Skambinti
Pasiūlymo informacija
- Sąrašo ID:
- A19531791
- Nuorodos Nr.:
- 24688
- Naujinta paskutinį kartą:
- Data 2025.07.10
Aprašymas
PANalytical
PANalytical X’Pert PRO MPD X-Ray Diffractometer (XRD)
Extract from Service Report:
Device: PANalytical X’Pert PRO MPD
Created on: 07.07.2021
Work Performed:
- Reinstallation and commissioning of the system
- Connection of external supply lines
- Warm-up phase
- Complete calibration of the goniometer and other components
- Maintenance including replacement of defective parts
Replacement parts used:
L 3.6V NC/U3 R15.0X52.0 BATTERY. NI-CD
Fan for X-Celerator unit
Filter, water
Motor PW3050
("Unit was not tested at our facility")
The X’Pert PRO MPD is a highly versatile and powerful X-ray diffractometer (XRD) designed for structural characterization of crystalline materials.
It is ideal for both pure research and routine applications in industry and academia. Its modular design, rapid detection capability, and precise temperature and atmosphere control make it excellently suited for both routine analyses and complex in-situ experiments.
Key Features:
Multiple measurement geometries possible:
• Reflection in Bragg-Brentano (θ–2θ) mode
• Transmission geometry for powders in capillaries
• Optionally SAXS (Small-Angle X-ray Scattering) for nanostructures
Radiation source and detectors:
Ibodpfxjwycate Acuoc
• Typically copper anode (Cu-Kα, λ ≈ 1.54 Å)
• X’Celerator detector (1D, ultra-fast) for parallel data acquisition
Modular system with PreFIX technology:
• Fast interchange of optics and sample stages without recalibration
In-situ measurements at high temperatures:
• Measurements possible up to approx. 1200°C
Controlled atmosphere: Air, nitrogen, oxygen (limited reducing atmosphere)
Typical Applications:
• Phase analysis and quantitative Rietveld refinement
• Determination of crystallite size, microstrain, residual stress
• In-situ investigation of phase transitions, oxidation, crystallization, etc.
• SAXS measurements for analysis of nanoparticles, pore structures
• Broad sample range: powders, thin films, ceramics, pharmaceuticals, catalysts, and more
Technical Specifications (typical):
Property & Specification
Angular range (2θ): approx. 0.5° to 150°
Step size: up to 0.002° or finer
Goniometer: Vertical, 0–0, radius approx. 240 mm
Temperature range: Room temperature to approx. 1200°C
Atmosphere: Air, N₂, O₂ (limited reducing conditions)
Detectors: X’Celerator (1D), proportional counter
Distribution & Areas of Application:
The X’Pert PRO MPD is in use worldwide, e.g. at:
Universities (ETH Zurich, TU Dresden, University of Vienna)
Research institutes (e.g. Max-Planck-Institutes, ICN2, IS2M)
Industry (e.g. materials development, pharma, chemicals)
Condition: used
Scope of delivery: (see pictures)
(Specifications subject to change and errors excepted!)
For further questions, please don’t hesitate to contact us by phone.
Skelbimas verčiamas automatiškai, todėl jame gali būtų vertimo klaidų.
PANalytical X’Pert PRO MPD X-Ray Diffractometer (XRD)
Extract from Service Report:
Device: PANalytical X’Pert PRO MPD
Created on: 07.07.2021
Work Performed:
- Reinstallation and commissioning of the system
- Connection of external supply lines
- Warm-up phase
- Complete calibration of the goniometer and other components
- Maintenance including replacement of defective parts
Replacement parts used:
L 3.6V NC/U3 R15.0X52.0 BATTERY. NI-CD
Fan for X-Celerator unit
Filter, water
Motor PW3050
("Unit was not tested at our facility")
The X’Pert PRO MPD is a highly versatile and powerful X-ray diffractometer (XRD) designed for structural characterization of crystalline materials.
It is ideal for both pure research and routine applications in industry and academia. Its modular design, rapid detection capability, and precise temperature and atmosphere control make it excellently suited for both routine analyses and complex in-situ experiments.
Key Features:
Multiple measurement geometries possible:
• Reflection in Bragg-Brentano (θ–2θ) mode
• Transmission geometry for powders in capillaries
• Optionally SAXS (Small-Angle X-ray Scattering) for nanostructures
Radiation source and detectors:
Ibodpfxjwycate Acuoc
• Typically copper anode (Cu-Kα, λ ≈ 1.54 Å)
• X’Celerator detector (1D, ultra-fast) for parallel data acquisition
Modular system with PreFIX technology:
• Fast interchange of optics and sample stages without recalibration
In-situ measurements at high temperatures:
• Measurements possible up to approx. 1200°C
Controlled atmosphere: Air, nitrogen, oxygen (limited reducing atmosphere)
Typical Applications:
• Phase analysis and quantitative Rietveld refinement
• Determination of crystallite size, microstrain, residual stress
• In-situ investigation of phase transitions, oxidation, crystallization, etc.
• SAXS measurements for analysis of nanoparticles, pore structures
• Broad sample range: powders, thin films, ceramics, pharmaceuticals, catalysts, and more
Technical Specifications (typical):
Property & Specification
Angular range (2θ): approx. 0.5° to 150°
Step size: up to 0.002° or finer
Goniometer: Vertical, 0–0, radius approx. 240 mm
Temperature range: Room temperature to approx. 1200°C
Atmosphere: Air, N₂, O₂ (limited reducing conditions)
Detectors: X’Celerator (1D), proportional counter
Distribution & Areas of Application:
The X’Pert PRO MPD is in use worldwide, e.g. at:
Universities (ETH Zurich, TU Dresden, University of Vienna)
Research institutes (e.g. Max-Planck-Institutes, ICN2, IS2M)
Industry (e.g. materials development, pharma, chemicals)
Condition: used
Scope of delivery: (see pictures)
(Specifications subject to change and errors excepted!)
For further questions, please don’t hesitate to contact us by phone.
Skelbimas verčiamas automatiškai, todėl jame gali būtų vertimo klaidų.
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