Jutiklis daugiasluoksniam storio matavimuiNirox
multi-Thick-MS1-CH
Jutiklis daugiasluoksniam storio matavimui
Nirox
multi-Thick-MS1-CH
Fiksuota kaina plius PVM
3 500 €
Būklė
Naudotas
Vieta
Borken 

Rodyti nuotraukas
Rodyti žemėlapį
Duomenys apie mašiną
- Mašinos pavadinimas:
- Jutiklis daugiasluoksniam storio matavimui
- Gamintojas:
- Nirox
- modelis:
- multi-Thick-MS1-CH
- Būklė:
- naudotas
Kaina ir vieta
Fiksuota kaina plius PVM
3 500 €
- Vieta:
- Einsteinstraße 8a, 46325 Borken, Deutschland

Skambinti
Pasiūlymo informacija
- Skelbimo ID:
- A19670356
- Nuorodos numeris:
- 24726
- Atnaujinimas:
- paskutinį kartą atnaujinta 29.07.2025
aprašymas
Nirox
Sensor Nirox multi-Thick-MS1-CH1
Nirox multi-Thick-MS1-CH1 – Sensor for multilayer thickness measurement
For sale is a high-quality optical sensor, type Nirox multi-Thick-MS1-CH1, designed for precise, non-contact measurement of multilayer materials such as plastic films, composites, or coated substrates. This sensor system is ideally suited for quality control in the plastics or packaging industry.
Technical Highlights:
Model: multi-Thick-MS1-CH1
Manufacturer: Nirox s.r.l. (Italy)
Function: Optical precision sensor for micrometer-accurate measurement of individual layer thicknesses
Measurement method: A-scan / optical interference analysis
Channel: 1 (CH1)
Areas of application: Inline measurement in production lines or laboratory use
Typical materials: Multilayer films, coated glass, technical laminates
Condition: used
Scope of delivery: (see image)
Cpodpfew Elmysx Aahow
Sensor multi-Thick-MS1-CH1
Connection cable
(Specifications subject to change and errors excepted!)
If you have further questions, we would be happy to assist you by phone.
Skelbimas buvo automatiškai išverstas. Galimos vertimo klaidos.
Sensor Nirox multi-Thick-MS1-CH1
Nirox multi-Thick-MS1-CH1 – Sensor for multilayer thickness measurement
For sale is a high-quality optical sensor, type Nirox multi-Thick-MS1-CH1, designed for precise, non-contact measurement of multilayer materials such as plastic films, composites, or coated substrates. This sensor system is ideally suited for quality control in the plastics or packaging industry.
Technical Highlights:
Model: multi-Thick-MS1-CH1
Manufacturer: Nirox s.r.l. (Italy)
Function: Optical precision sensor for micrometer-accurate measurement of individual layer thicknesses
Measurement method: A-scan / optical interference analysis
Channel: 1 (CH1)
Areas of application: Inline measurement in production lines or laboratory use
Typical materials: Multilayer films, coated glass, technical laminates
Condition: used
Scope of delivery: (see image)
Cpodpfew Elmysx Aahow
Sensor multi-Thick-MS1-CH1
Connection cable
(Specifications subject to change and errors excepted!)
If you have further questions, we would be happy to assist you by phone.
Skelbimas buvo automatiškai išverstas. Galimos vertimo klaidos.
Tiekėjas
Pastaba: Užsiregistruokite nemokamai arba prisijunkite, kad gautumėte visą informaciją.
Registruotas nuo: 2012
Siųsti užklausą
Telefonas & Faksas
+49 2861 ... skelbimai
Šie skelbimai taip pat gali jus sudominti.
Mažas skelbimas
Sonsbeck
1 224 km
Tempimo bandymo mašina - universali bandymo mašina
Richard Hess MBV GmbHH3000-H5000TM mit Langwegextensometer
Richard Hess MBV GmbHH3000-H5000TM mit Langwegextensometer
Mažas skelbimas
Oradea
914 km
3D skaitytuvas
Dental WingsDW-5-140
Dental WingsDW-5-140
Mažas skelbimas
Wiefelstede
1 046 km
EKTAPRO HS judesio analizatorius
KodakModel 4540
KodakModel 4540
Mažas skelbimas
Lüdenscheid
1 163 km
Automatinė matavimo sistema (kaip "Vester")
IMTSMessanlage, Rissprüfung
IMTSMessanlage, Rissprüfung
Mažas skelbimas
Wernau (Neckar)
1 223 km
Dujų analizatorius / Emisijų matavimo prietaisas
Sick AG / Endress HauserMKAS / GMS800 FIDOR
Sick AG / Endress HauserMKAS / GMS800 FIDOR
Mažas skelbimas
Dietfurt an der Altmühl
1 084 km
Duomenų rinkimo / perjungimo blokas
Agilent34970A
Agilent34970A
Mažas skelbimas
Wiefelstede
1 046 km
Filtrų tikrinimo bandymo stendas
LorenzFMP 03 FH 143/149
LorenzFMP 03 FH 143/149
Jūsų skelbimas sėkmingai pašalintas
Įvyko klaida





























































