Bruker Microflex pirkti naudotą (4)

Būklė: naudotas, Šis įrašas skirtas Bruker microflex masės spektrometrui. Įrenginys yra visiškai veikiantis ir paruoštas nedelsiam naudojimui. Bruker Microflex – tai matricės pagalba lazeriu desorbuojamas/ionizuojamas skriejimo laiko masės spektrometras (MALDI-TOF MS), daugiausia naudojamas greitam mikroorganizmų, biomolekulių (pvz., baltymų ir peptidų) bei polimerų identifikavimui. Tai yra Bruker MALDI Biotyper serijos dalis. Pagrindiniai komponentai: - Lazerio šaltinis: azoto arba kietojo kūno lazeris (dažniausiai 337 nm UV) - Jonų šaltinis: vakuuminė kamera su MALDI taikinio plokštele - Skriejimo vamzdis: matuoja jonų skriejimo laiką - Detektorius: konvertuoja jonų atvykimo laikus į masės spektrą Dsdpfx Asxhdxqef Aout - MALDI taikinio plokštelė: metalinė plokštelė, ant kurios užlašinami su matrica sumaišyti mėginiai Veikimo principas (supaprastintai): 1. Mėginio paruošimas: analizė sumaišoma su MALDI matrica (pvz., α-cyano-4-hydroxycinnamic acid). 2. Lazerio jonizacija: lazeris veikia matricą, kuri jonizuoja mėginį. 3. Jonų pagreitinimas: jonai pagreitinami į TOF analizatorių. 4. Detekcija: matuojamas skriejimo laikas; mažesni jonai detektorių pasiekia greičiau. 5. Spektras: santykis masė/krūvis (m/z) vaizduojamas prieš intensyvumą. Fizinės charakteristikos (apytiksliai): - Užimamas plotas: stalinis dydis (apie 80 cm plotis) - Svoris: ~100–120 kg (priklauso nuo modelio/versijos) - Maitinimas: standartinis laboratorinis elektros tiekimas - Aplinka: reikalingos švarios, stabilios temperatūros ir drėgmės sąlygos

Būklė: naudotas, Ausgebaut aus einer laufenden Maschine. Bitte sehen Sie sich auch unsere weiteren Angebote an. Dodpfjwxax Dox Af Aeut

Būklė: naudotas, Bruker Type: Tensor 27 IR Spectrometer Maximum sample flexibility. Thanks to the improved QuickLockTM mechanism and the locking button on the front, even bulky accessories can be installed quickly and, above all, safely. Additionally, the INVENIO can be equipped with three software-controlled beam outputs for a wide range of external modules. FPA micro and macro imaging Variable external sample chamber (left and right) for individual experiments Dodevwcikepfx Af Aeut Fiber optic coupling to fiber probes for liquids and solids Integrating sphere Autosampler for liquids High-throughput analysis module HTS-XT Reflection unit for the air-water phase boundary Much more! Condition: used Scope of delivery: (see picture) (Subject to changes and errors in the technical data and specifications!) We are happy to answer any further questions by phone.

Būklė: labai geros būklės (naudotas), Type: Jeol JSM-6490 Jeol JSM-6490 Scanning Electron Microscope (PC-SEM) Modern, high-resolution, digital scanning electron microscope featuring a newly developed electron optics system and intuitive graphical user interface (GUI) running on Microsoft Windows XP Professional. Device configuration includes the following features: - Magnification range: 5X – 300,000X - Accelerating voltage: 0.3 – 30 kV - Tungsten hairpin cathode (LaB6 cathode optional) - Large, fully motorized specimen stage with eccentric tilt function, including graphical navigation on the specimen holder - Simple specimen navigation via click-center-zoom - Image field-controlled navigation with 2 navigators - Relative coordinates navigation - Saving and recall of specimen positions - Adjustable image-framing method for the specimen stage - Image field correction during rotation via computer-controlled eccentric rotation - Image field correction during tilting via computer-controlled eccentric tilting - Calculation of possible tilt angle based on specimen geometry - Automatic focus tracking when moving the specimen in the Z-direction - Intelligent limit switches for the motorized axes Specimen stage travel: x = 125 mm y = 100 mm z = 5 to 80 mm (stepless) T = -10°C to +90°C R = 360° (continuous) - Secondary electron detector for high-vacuum operation - Novel superconic objective lens guarantees maximum image resolution even at high tilt angles - Guaranteed resolution in SE image: 3 nm at 30 kV and 15 nm at 1 kV - Simultaneous live imaging from multiple detectors - Powerful image measurement functions - Movie function for recording dynamic processes - Versatile specimen chamber with numerous upgrade options: free flanges e.g. for EDX, WDX, EBSD, cathodoluminescence etc. - Low-maintenance and low-wear, quiet pumping system consisting of fore pump, vibration-free high-performance diffusion pump, and electromagnetic valve control - Comprehensive safety features against incorrect operation and external media failure - Ergonomic, height-adjustable system table - SEM starter kit comprising 2 specimen holders, tool kit, and 6 replacement cathodes Additional equipment for the scanning electron microscope: - Turbomolecular pump instead of the standard diffusion pump - When a turbomolecular pump is used, no cooling water is required for SEM operation Further SEM features: - PC for SEM control including TFT monitor - ΟΧ200 Bruker Quantax 200 EDX System EXTENDED - Bruker EDX software will be transferred to the new owner after purchase! Nitrogen-free energy-dispersive X-ray analysis system, including: - SDD detector with 127 eV or better energy resolution - Detection of all elements from boron upwards - Vibration-free, maintenance-free. Peltier-cooled (nitrogen-free) - Pulse processor - TFT monitor - Spectrum measurement and element identification - Fully automatic, quantitative, standardless element analysis - Image acquisition - Ultra-fast qualitative line scan - Ultra-fast qualitative element mapping - Data management and archiving system - Report generation and result output - Data communication - Installation and training HyperMap Multipoint analysis Bruker xFlash detector (SDD) with SVE III signal processing unit Scope of delivery: (see photos) Duodpfxomn Rcqe Af Ajt Condition: used (Specifications may be subject to change or error!)