Skenuojantis elektroninis mikroskopas (PC-SEM)

Jeol JSM-6490 Bruker XFlash Detektor

Here we offer you a Jeol scanning electron microscope.

Jeol JSM-6490 Scanning Electron Microscope (PC-SEM)

Modern, high-resolution, digital scanning electron microscope with newly developed electron optics and intuitive, graphical user interface (GUI) running on Microsoft WindowsXP Professional.

Magnification range: 5 X - 300,000 X
Acceleration voltage: 0.3 - 30 kV
Tungsten hairpin cathode (LaB6 cathode optional)
Large, fully motorized specimen stage with concentric tilt function, including:
Graphical navigation on the specimen holder
Easy sample navigation with click-center-zoom
Field-controlled navigation via 2 navigators
Relative coordinates navigation
Save and recall sample positions
Adjustable image field selection procedure for the stage
Image field correction during rotation via computer-controlled concentric rotation
Image field correction during tilt via computer-controlled concentric tilt
Calculation of maximum tilt angle based on sample geometry
Automatic focus tracking when the sample is moved in the Z-direction
Intelligent limit switches for the motorized axes

Stage travel:
x=125mm
y=100mm
z=5 to 80mm (stepless)
T= -10°C to +90°C
R= 360° (endless)
Secondary electron detector for high vacuum operation
Innovative super-conical objective lens ensures highest image resolution even at large tilt angles
Guaranteed SE image resolution: 3 nm at 30 kV and 15 nm at 1 kV
Simultaneous live image display from multiple detectors
Easy navigation through click-center-zoom
Powerful image measurement functions
Movie function for recording dynamic processes
Versatile specimen chamber with many extension options: free ports e.g. for EDX, WDX, EBSD, cathodoluminescence etc.
Low-maintenance, low-wear, quiet pump system, consisting of forepump, vibration-free high-power diffusion pump, and electromagnetic valve control
Comprehensive error protection against misoperation and failure of external media
Ergonomic, height-adjustable system table
SEM starter kit consisting of 2 specimen holders, tool set, and 6 spare cathodes

Additional equipment

2x ΜΡ-43100 (TMP)

Turbomolecular pump
Instead of the standard diffusion pump
With a turbomolecular pump, no cooling water is required for SEM operation.

Further equipment:

PC for SEM control including TFT monitor

ΟΧ200 Bruker Quantax 200 EDX System EXTENDED

Nitrogen-free energy dispersive X-ray analysis system including:
SDD detector with 127 eV or better energy resolution
Detection of all elements starting from boron
Vibration-free, maintenance-free. Peltier cooled (nitrogen-free)
Pulse processor
TFT monitor
Spectrum measurement and element identification
Fully automatic, quantitative, standardless elemental analysis
Image acquisition
Ultra-fast qualitative line scan
Ultra-fast qualitative element mapping
Data management and archiving system
Report generation and results output
Data communication
Installation and training
HyperMap
Multipoint analysis

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Bruker xFlash detector (SDD) with SVE III signal processing unit

Type: Jeol JSM-6490

Scope of delivery: (see pictures)

Condition: used

(Specifications and data are subject to change and error!)
We are happy to answer any further questions for you by phone.

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