Skenuojantis elektroninis mikroskopas (PC-SEM)

Jeol JSM-6490 Bruker XFlash Detektor

Type: Jeol JSM-6490
Jeol JSM-6490 Scanning Electron Microscope (PC-SEM)
Modern, high-resolution, digital scanning electron microscope featuring a newly developed electron optics system and intuitive graphical user interface (GUI) running on Microsoft Windows XP Professional.

Device configuration includes the following features:
- Magnification range: 5X – 300,000X
- Accelerating voltage: 0.3 – 30 kV
- Tungsten hairpin cathode (LaB6 cathode optional)
- Large, fully motorized specimen stage with eccentric tilt function, including graphical navigation on the specimen holder
- Simple specimen navigation via click-center-zoom
- Image field-controlled navigation with 2 navigators
- Relative coordinates navigation
- Saving and recall of specimen positions
- Adjustable image-framing method for the specimen stage
- Image field correction during rotation via computer-controlled eccentric rotation
- Image field correction during tilting via computer-controlled eccentric tilting
- Calculation of possible tilt angle based on specimen geometry
- Automatic focus tracking when moving the specimen in the Z-direction
- Intelligent limit switches for the motorized axes

Specimen stage travel:
x = 125 mm
y = 100 mm
z = 5 to 80 mm (stepless)
T = -10°C to +90°C
R = 360° (continuous)

Gbodpemn Rcqsfx Afdon
- Secondary electron detector for high-vacuum operation
- Novel superconic objective lens guarantees maximum image resolution even at high tilt angles
- Guaranteed resolution in SE image: 3 nm at 30 kV and 15 nm at 1 kV
- Simultaneous live imaging from multiple detectors
- Powerful image measurement functions
- Movie function for recording dynamic processes
- Versatile specimen chamber with numerous upgrade options: free flanges e.g. for EDX, WDX, EBSD, cathodoluminescence etc.
- Low-maintenance and low-wear, quiet pumping system consisting of fore pump, vibration-free high-performance diffusion pump, and electromagnetic valve control
- Comprehensive safety features against incorrect operation and external media failure
- Ergonomic, height-adjustable system table
- SEM starter kit comprising 2 specimen holders, tool kit, and 6 replacement cathodes

Additional equipment for the scanning electron microscope:
- Turbomolecular pump instead of the standard diffusion pump
- When a turbomolecular pump is used, no cooling water is required for SEM operation

Further SEM features:
- PC for SEM control including TFT monitor
- ΟΧ200 Bruker Quantax 200 EDX System EXTENDED
- Bruker EDX software will be transferred to the new owner after purchase!

Nitrogen-free energy-dispersive X-ray analysis system, including:
- SDD detector with 127 eV or better energy resolution
- Detection of all elements from boron upwards
- Vibration-free, maintenance-free. Peltier-cooled (nitrogen-free)
- Pulse processor
- TFT monitor
- Spectrum measurement and element identification
- Fully automatic, quantitative, standardless element analysis
- Image acquisition
- Ultra-fast qualitative line scan
- Ultra-fast qualitative element mapping
- Data management and archiving system
- Report generation and result output
- Data communication
- Installation and training

HyperMap
Multipoint analysis
Bruker xFlash detector (SDD) with SVE III signal processing unit

Scope of delivery: (see photos)
Condition: used
(Specifications may be subject to change or error!)

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