Skenuojantis elektroninis mikroskopas (PC-SEM)

Jeol JSM-6490 Bruker XFlash Detektor

Here we offer you a Jeol scanning electron microscope.

Jeol JSM-6490 Scanning Electron Microscope (PC-SEM)

Modern, high-resolution, digital scanning electron microscope with newly developed electron optics and intuitive, graphical user interface (GUI) running on Microsoft WindowsXP Professional.

Magnification range: 5 X - 300,000 X
Acceleration voltage: 0.3 - 30 kV
Tungsten hairpin cathode (LaB6 cathode optional)
Large, fully motorized specimen stage with concentric tilt function, including:
Graphical navigation on the specimen holder
Easy sample navigation with click-center-zoom
Field-controlled navigation via 2 navigators
Relative coordinates navigation
Save and recall sample positions
Adjustable image field selection procedure for the stage
Image field correction during rotation via computer-controlled concentric rotation
Image field correction during tilt via computer-controlled concentric tilt
Calculation of maximum tilt angle based on sample geometry
Automatic focus tracking when the sample is moved in the Z-direction
Intelligent limit switches for the motorized axes

Stage travel:
x=125mm
y=100mm
z=5 to 80mm (stepless)
T= -10°C to +90°C
R= 360° (endless)
Secondary electron detector for high vacuum operation
Innovative super-conical objective lens ensures highest image resolution even at large tilt angles
Guaranteed SE image resolution: 3 nm at 30 kV and 15 nm at 1 kV
Simultaneous live image display from multiple detectors
Easy navigation through click-center-zoom
Powerful image measurement functions
Movie function for recording dynamic processes
Versatile specimen chamber with many extension options: free ports e.g. for EDX, WDX, EBSD, cathodoluminescence etc.
Low-maintenance, low-wear, quiet pump system, consisting of forepump, vibration-free high-power diffusion pump, and electromagnetic valve control
Comprehensive error protection against misoperation and failure of external media
Ergonomic, height-adjustable system table
SEM starter kit consisting of 2 specimen holders, tool set, and 6 spare cathodes

Additional equipment

2x ΜΡ-43100 (TMP)

Turbomolecular pump
Instead of the standard diffusion pump
With a turbomolecular pump, no cooling water is required for SEM operation.

Further equipment:

PC for SEM control including TFT monitor

ΟΧ200 Bruker Quantax 200 EDX System EXTENDED

Nitrogen-free energy dispersive X-ray analysis system including:
SDD detector with 127 eV or better energy resolution
Detection of all elements starting from boron
Vibration-free, maintenance-free. Peltier cooled (nitrogen-free)
Pulse processor
TFT monitor
Spectrum measurement and element identification
Fully automatic, quantitative, standardless elemental analysis
Image acquisition
Ultra-fast qualitative line scan
Ultra-fast qualitative element mapping
Data management and archiving system
Report generation and results output
Data communication
Installation and training
HyperMap
Multipoint analysis

Bruker xFlash detector (SDD) with SVE III signal processing unit

Type: Jeol JSM-6490

Scope of delivery: (see pictures)

Condition: used

(Specifications and data are subject to change and error!)
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We are happy to answer any further questions for you by phone.

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