Matavimo sistema

Leica EM TXP

The EM TXP is a unique device developed for precise preparation of a wide range of materials and material composites featuring minimal local defects. It is specially designed for cutting, milling, grinding, and polishing demanding, small, and awkward specimens, where the working process is monitored using a stereomicroscope, and a final inspection is conducted in a scanning electron microscope or light microscope without interrupting the individual workflow steps.

The EM TXP offers, among other things, a very good option for pre-preparation of materials for which a bevel cut will be produced using an ion polishing system.

Supplied with the following accessories:
1 pc. Complete M80 stereomicroscope
1 pc. Crosshair plate for M80, 12 mm
1 pc. Movable objective adapter for M80
1 pc. Angle adjustment adapter
1 pc. Diamond saw blade
1 pc. Diamond saw blade
1 pc. Special cutter with 6 mm Ø diamond edge
1 pc. Special cutter with 12 mm Ø diamond edge
1 pc. Special cutter with 8 mm Ø WC cutter
1 pc. Special cutter with 12 mm Ø WC cutter
5 pcs. Arbor
3 pcs. Carrier for lapping film
1 pc. Lapping film 15 µm, SiC, Ø 30 mm
1 pc. Lapping film 9 µm, SiC, Ø 30 mm
1 pc. Lapping film 5 µm, SiC, Ø 30 mm
3 pcs. Carrier for lapping film
1 pc. Lapping film 9 µm, diamond (Type U)
1 pc. Lapping film 2 µm, diamond (Type U)
1 pc. Lapping film 0.5 µm, diamond (Type U)
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1 pc. Lapping film 0.1 µm, diamond (Type LA)
3 pcs. Carrier for lapping film
1 pc. Lapping film 9 µm, aluminium oxide
1 pc. Lapping film 3 µm, aluminium oxide
1 pc. Lapping film 1 µm, aluminium oxide
1 pc. Lapping film 0.3 µm, aluminium oxide
1 pc. Neoprene cloth for final polishing (8 pcs.)
2 pcs. Box for carriers and films
1 pc. Holder for flat specimens 0–4 mm
1 pc. Flat specimen holder 3–8 mm
1 pc. TXP SEM stub holder
1 pc. Universal specimen holder

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